What is the expected data retention of the eMMC used in the OSD335x C-SiP?

We use a standard eMMC v5.1 backward compatible with eMMC standard 4.3 which is what AM335x supports. The eMMC we use is rated for 3000 Program-Erase cycles in MLC(Multi-level Cell) mode. You can extend the reliability of the eMMC by placing it in pseudo-SLC(Single-level Cell) mode but you will sacrifice half of the capacity to do this. Pseduo SLC mode is described as “Enhanced storage media”. The specification indicates that a specific segment of the User Data Area can be implemented as Enhanced storage media. But, this would be non reversible. Reliability of eMMC devices is greatly increased by the wear-levelling techniques implemented inside the eMMC. See https://www.micron.com/-/media/client/global/documents/products/technical-note/nand-flash/tn2942_nand_wear_leveling.pdf for more information.

Data retention will vary based on the # of read/write cycles the individual cell has gone through inside the eMMC. Typically, less used cells can retain information longer(up to 5 years). More Info on general flash storage life expectancy can be found here: https://www.ni.com/en-us/support/documentation/supplemental/12/understanding-life-expectancy-of-flash-storage.html

Commands that show the ‘health’ of an eMMC device are defined in the specification. See https://developer.toradex.com/knowledge-base/emmc-linux#Health_Status. These should be part of mmc-utils(https://git.kernel.org/pub/scm/linux/kernel/git/cjb/mmc-utils.git/) developed to interface with eMMC devices.